Product Description
This model use an external UL-listed power supply to provide all the electrical power required by the d33 meter.
The only power supply for the d33 meter is the UL-listed power supply (output DC +/-12 V, + 5 V, 50 W).
This unit meets the NRTL certification requirement of certain large companies and national lab.
Great technical support from State College, PA, USA. We have over 100 customers in Europe, USA, Japan, China, and South Korea. In stock and ship within 24 hours after order.
We provide great technical support to our customers. This d33 meter has been sold to over 100 prestigious universities in the USA, Europe, Japan, as well as many Fortune 500 companies and piezo companies around the world.
Economy Berlincourt piezoelectric meter PKD3-2000 to measure d33 of polymer PVDF, PVDF-TrFE, or piezoelectric ceramic materials. Two measurement ranges: 10 to 2,000pC/N, or 1 to 200pC/N, Force 0.25N, Frequency 110 Hz
It works great with both piezo ceramics and polymers such as PVDF and PVDF-TrFE or PLLA or polymer nanocomposites. Also work for thin film on conductive substrate (silicon wafer with electrode) such as AlN aluminum nitride.
Other model includes PKD3-4000 with measurement range up to 7000 pC/N for single crystal PMNPT ceramic.
This unit comes with PolyK static force sensor to improve the measurement accuracy and reproducibility.
The sample fixture has M3 thread and it includes one set of hemisphere fixture and one set of flat fixture (8 mm diameter). You can also machine your own fixture easily as long as it has M3 connectors.
Come with piezo standard for calibrating the d33 meter.
BNC monitor connectors can be added to the back panel so you can use computer-DAQ to monitor the output.
Four Options:
1. Piezo d33 meter + static force sensor
2. Piezo d33 meter + static force sensor + 300 C temperature chamber (manual temperature controller with digital controller).
3. Piezo d33 meter + static force sensor + 600 C temperature chamber (manual temperature controller with digital controller).
4. Upgrade to software control, including a laptop computer with Windows 11. Can automatically controll temperature (ramp at constant heatign rate, or isothermal measurement), record temperature, d33, and static force. This is additional cost to the previous four options.
In Stock, ship within 24 hours after order, ship from State College, PA 16803, USA.
Effect of PVDF Piezo film thickness and static force sensor on the measured d33 value [when you measure soft materials, you are measuring combined piezo effect from d33, d31, and d32 as the sample has deformation (thinner)]
For video: http://youtu.be/l9KKBhBK2u0
Video Instructions: http://youtu.be/5mZe-V88t88
During piezo d33 measurement, there is a static force and a dynamic force applied on the sample. The dynamic force 0.25N/110Hz is controlled by the meter, the static force is controlled by the user (how hard to move the top probe down to squeeze your sample). In most commercial d33 meters, the static force is controlled by the operator’s “finger” feeling. For soft and fragile polymers (PVDF, PVDF-TrFE, or PLLA, etc), electret, foam, or crystal, the static force can significantly the measured d33 value (see the d33 of PVDF and ceramic PZT under different static force), therefore, many users complained the reproducibility of d33 of polymer piezo materials measured with standard d33 meters. Similar issue is also surprisingly found in rigid piezoelectric ceramic PZT plate samples.